Resin Plugging & Via-in-Pad

Resin Plugging & Via-in-Pad

Filled vias and via-in-pad structures for HDI, BGA breakout and better thermal paths.

Resin Plugging & Via-in-Pad (VIP/VIPPO) 

Flat, void-controlled VIP delivers reliable micro-BGA assembly, shorter routes (VOP), better thermal paths, and cleaner high-speed signals.

 

Process Capability Matrix(Core Specs)

Technology

Use Cases

Min Via / Pad

Max Lamination Cycles

Max Layers

Planarity (µm)

Copper Cap (µm)

Standards / Notes

VIP (Copper-Capped)

Micro-BGA, CSP, RF/5G

Laser ≥0.050 mm / Pad ≥0.2 mm

6–7

20–26

≤15–20

≤12 µm

IPC-4761 Type VII, VOP-ready

Resin-Plugged Through-Via

Via transfer under BGA

0.10–0.50 mm

6–7

20–26

≤25

Optional re-copper

Lower flux residue, higher SMT yield

Copper-Filled Microvia

Stacked / Skip

0.075–0.10 mm

6–7

14–20

≤10–15

Co-grows with surface Cu

For stacked vias, stub reduction

 

 

 

DFM & Package Rules(Designer-Ready)

Type

Via Ø (mm)

Pad Ø (mm)

Fill Type

Mask Strategy

Typical Fan-out

SMT Readiness

Laser VIP (Microvia)

0.075–0.10

0.25–0.32

Epoxy (NCF)

Tent or micro-window

0.40–0.50 mm BGA

Planarity ≤10–15 µm

Thru-Via Plug & Cap

0.20–0.30

0.28–0.40

Epoxy (NCF/CF)

Cover or windowed thermal

Power/thermal pads

Reduced ball collapse

Stacked VIP (1-n)

0.075–0.10

0.25–0.32

Epoxy (NCF)

Align with upper VIP

HDI build-up

Recommend SM-tented

Thermal VIP Array

0.10–0.30

Via + 0.15–0.22

Epoxy(CF opt.)

Windowed mask opt.

Large thermal pads

Enhanced heat path

 

 

 

Manufacturing Flow & QC Checkpoints

Laser/Mech drilling → Desmear & plasma → Cu seed (PTH) → Pattern plating → Vacuum resin plug → Cure & planarization → Local copper-cap plating → Solder mask strategy → Finish (ENIG/ENEPIG/OSP) → X-ray / cross-section / white-light interferometry.

 

 

 

 

Assembly Collaboration(SMT-Ready)

Stencil: reduce aperture 5–10% for VOP pads; segment large thermal pads. Reflow: follow paste profile, ensure adequate soak on heavy-copper/thermal pads. Cleaning: low flux residue with plugged vias reduces ionic risk.

 

 

 

Typical Stack-ups & Use Cases

0.40 mm BGA: L1 VIP → L2 (VOP fan-down), TDR target ±5–8%, back-drill stub ≤ 0.20 mm. Thermal pads: 0.25–0.30 mm via array + CF plug + windowed mask tied to copper pour.

 

 

 

Common Defects → Countermeasures

Ball collapse/opens → tighter planarity, stencil reduction, reflow tuning. Solder beads/wicking → VIPPO mask cover, resin cure, window strategy. Large voids → vacuum plug recipe & cure pressure, grind planarity. Delam/cracks → stack-up CTE match, stop-flow design, cure curve. Impedance drift → copper roughness & dielectric control, back-drill.

 

 

 

Quality Standards & Verification

Standards: IPC-4761 Type VII, IPC-6012 Class 2/3, IPC-6018 (RF). Verification: X-ray (void ≤ 5%), cross-section, WLI planarity, TDR (±5–8%).

 

 

 

FAQs

Q: What’s the difference between VIP and VIPPO?
VIP is via-in-pad; VIPPO is VIP with solder-mask-over-pad for anti-wicking and better planarity.

 

Q: When to choose copper-filled microvia?
For stacked/skip structures to reduce stubs and improve reliability in dense HDI.

 

Q: Why is planarity critical?
≤15–20 µm reduces opens/bridges on fine-pitch BGAs and stabilizes paste transfer.

Get Custom Quote

PRODUCTS CENTER

Supported formats: PDF, DWG, Gerber, Excel (Max 50MB)
Submit