Minimum Trace / Space

Minimum Trace / Space

Fine line/space capability for dense layouts and compact form factors.

Minimum Trace / Space — Process Capabilities & DFM Guide

Finer trace/space increases routing density, shortens BGA escapes, and tightens impedance on thin dielectrics—critical for HDI and high-speed designs.

 

 

Process Capability Matrix(Finished Geometry)

Layer / Copper

Standard

Advanced

Notes

Outer, 12–18 µm (⅓–½ oz)

2.0/2.0 mil

1.4/1.4 mil

LDI + tight SPC

Outer, 35 µm (1 oz)

2.5/2.5 mil

2.0/2.0 mil

More undercut → more comp.

Inner, 18–35 µm

2.5/2.5 mil

2.0/2.0mil

Registration & smear control

Heavy copper 2–3 oz

5.0/5.0–6.0/6.0 mil

4.0/4.0 mil

Deep-etch control

Ultra heavy 4–10 oz

8.0/8.0–12/12 mil

Per application

 

 

 

Geometry & Etch Compensation(Designer-Ready)

  • Etch compensation: Add +10–25% width (outer 1 oz typically +15–20%); confirm per copper & stack-up.
  • Solder-mask dams: LPI ≥3 mil (75 µm); LDI mask on review ≈2.5 mil (65 µm).
  • Copper balance: Use thieving/mesh; avoid large voids near fine lines.
  • Annular ring: Finished ≥3–4 mil (outer), ≥2–3 mil (inner), drill-tolerance dependent.

 

 

BGA Fan-out Guidance

BGA Pitch

Typical Escape

Notes

0.80 mm

3/3 mil + dog-bone

Standard FR-4 workable

0.65 mm

3/3 or 2.5/2.5 mil; VIP optional

Prefer LDI

0.50 mm

VIP/VOP + 2.5/2.5 mil

Any-layer HDI helpful

0.40 mm

VIP/VOP + 2.0/2.0 mil (or 1.4/1.4 on reviewed HDI)

Stacked microvias likely

 

 

 

Manufacturing Flow & Controls

LDI imaging → Fine-line dry film → Uniform pattern plating → Controlled SES etch → AOI (5–7 µm pixel) → Micro-repair rules → Mask registration → Finish.

 

 

 

Quality & Verification

Cross-section for finished width/space and profile; AOI database vs. CAM nominal; TDR sampling when fine-line routes carry HSD.

 

 

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