Castellated Hole / Half Hole

Castellated Hole / Half Hole

Edge-plated half holes for modules and board-to-board connections.

Castellated Hole / Half Hole — Process Capabilities & DFM Guide

Castellated edges turn modules into solderable “SMD headers,” enabling quick SMT attach, easy inspection, and strong mechanical anchoring—ideal for RF/IoT modules, power daughterboards, and pre-certified wireless cards.

 

 

Process Capability Matrix(Finished Spec)

Item

Typical

Premium (upon review)

Notes

Finished half-hole Ø (original drill)

≥0.35 mm

0.35 mm

Smaller sizes increase burr risk

Pitch (center-to-center)

≥0.50 mm

≥0.45 mm

Keep solder mask off gaps

Annular ring (finished)

≥0.20 mm

≥0.15 mm

After etch/plating compensation

Hole wall copper

≥20 µm

≥25 µm

Uniformity critical at cut edge

Surface finish

ENIG / ENEPIG

HASL possible but less uniform

Edge milling tool

0.8–1.6 mm

Tool radius defines notch shape

Edge-to-inner copper

≥0.25–0.30 mm

≥0.20 mm

Prevent plane exposure

Board thickness

0.6–2.0 mm

0.4–3.2 mm

Thin cores require panel support

 

 

 

DFM & Padstack Rules(Designer-Ready)

  • Padstack: Through-hole pad with finished AR ≥0.20 mm; keep solder mask clearance ≥0.10–0.15 mm from scallop rim.
  • Cut line: Program the milling path through hole centers (≈50% cut) to form consistent half-moons.
  • Copper keep-out at edge: Inner planes/pours set back ≥0.25–0.30 mm from board edge.
  • Finish: Prefer ENIG/ENEPIG for wetting and inspection; avoid HASL bridging when pitch <1.0 mm.
  • Fiducials: Place local fiducials near castellated edges to stabilize routing accuracy.
  • Mechanical tie-in: Add corner tooling holes/stiffeners or edge tabs for panel stability.

 

 

Manufacturing Flow & Controls

PTH drill → Desmear/PTH Cu seed → Pattern plate (hole wall Cu build) → Finish (ENIG/ENEPIG) → Edge routing to cut through holes → Deburr / micro-chamfer → Final clean & AOI → 100% visual for continuity and burrs.
Controls: Tool wear & run-out, burr/tear at copper rim, continuity of Cu/Ni/Au at exposed half-barrels, edge fiber pull-out control.

 

 

 

Quality & Acceptance(IPC Reference)

  • Continuity: Cu/Ni/Au must be continuous across the exposed half-barrel (visual + cross-section sampling).
  • Burrs/tears: None visible; micro-chamfer 0.05–0.15 mm acceptable.
  • Solderability: Wetting verified via module reflow test; bridge-free fillet profile expected.
  • Reference: IPC-A-600 Class 2/3 (edge condition), IPC-6012 acceptance for PTH integrity.

 

 

 

Typical Applications

RF/IoT modules (Wi-Fi/BT/LTE/LoRa), GNSS, power daughterboards, sensor carriers, USB/UART bridges, castellated DevKit boards.

 

 

 

Common Issues → Countermeasures

  • Burrs/rough scallops → Sharper tool, reduced feed near holes, add micro-chamfer pass.
  • Inner copper exposure → Increase edge keep-out; verify layer registration before routing.
  • Poor wetting/bridging → Switch to ENIG/ENEPIG; widen pitch or increase mask clearance.
  • Cracked half-barrel → Increase hole wall Cu; verify plating uniformity before routing.

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