UltroNiu Awarded Patent for Innovative Beidou Terminal Chip Testing Device

A Beidou terminal is a device that utilizes the Beidou Satellite Navigation System for positioning and navigation. The system, comprising space, ground, and user segments, provides high-precision, reliable positioning, navigation, and timing services 24/7 to diverse users, featuring short-message communication capabilities and initial regional navigation, positioning, and timing functions. During the testing process of Beidou terminal chips, a specialized PCB board testing device is required. However, existing testing devices often suffer from poor chip fixation, which can lead to damage from excessive compression, and lack dust removal functionality, potentially compromising the detection accuracy of the chip testing circuit boards. To address these issues, UltroNiu has developed and patented an advanced "Testing Device for Beidou Terminal Chips."

UltroNiu Technical Solution

1. Synchronized Drive Mechanism: A motor is mounted on the top side of the base, with its output shaft fixed to the rear side of one of three sprockets. The motor drives the three sprockets to rotate synchronously, which in turn drives two incomplete gears to rotate in the same direction. This causes a gear rack to move horizontally back and forth, driving a pawl to operate in the same horizontal direction and initiating intermittent clockwise rotation.
2. Integrated Testing Unit: A tester is installed on top of the base, and a fixed alarm is positioned on top of the detector, enabling comprehensive testing of the Beidou chip using the tester.
3. Guided Movement: The vertical rod features an internal through-hole, with the outer side of the gear rack movably connected to the inner side of the hole. This through-hole guides the horizontal movement of the gear rack, ensuring precision.
4. Real-Time Data Analysis: The testing device incorporates real-time data analysis functionality, allowing for continuous monitoring of test data and the automatic generation of detailed test reports.

UltroNiu Innovative Advantages

• Efficient Transportation & Testing: The device utilizes a combination of pulleys and sprockets driven by a motor to transport the chip while simultaneously conducting tests, significantly increasing chip testing efficiency.
• Multi-Parameter Testing Capability: Supports testing of multiple parameters such as positioning accuracy, sensitivity, and power consumption, enabling a comprehensive performance evaluation of the Beidou terminal chip.
• Intelligent Fault Diagnosis: Equipped with intelligent fault diagnosis functionality, the device can automatically analyze test data, identify potential issues and anomalies, and provide corresponding solutions.
• Modular Design: Features a modular design that allows for configuration and expansion based on actual requirements, enhancing the flexibility and applicability of the testing device.

Problems Solved by UltroNiu

• Resolves the inability to test chips of different specifications and models with a single device.
• Addresses the low level of automation in traditional testing processes.
• Mitigates the risk of test data being leaked or tampered with during transmission.

Expected Project Objectives

• Seamless integration with automated testing platforms for streamlined workflows.
• Ability to determine whether chip performance meets specifications through precise analysis of test data.