Engineering Summary
At 28 GHz, copper roughness Ra has a directly measurable impact on insertion loss. Tests on 50 Ω microstrip lines (Rogers RO4350B, 8‑mil core) show: ED copper (Ra≈2.0 µm): 0.85 dB/cm; Low‑profile ED (Ra≈1.2 µm): 0.72 dB/cm; RTF (Ra≈0.8 µm): 0.61 dB/cm; HVLP (Ra≈0.4 µm): 0.52 dB/cm. Switching from ED to HVLP reduces loss by ~39% at 28 GHz.
Loss Summary Table (28 GHz, 50 Ω microstrip, RO4350B)
| Copper type | Typical Ra (µm) | Measured insertion loss (dB/cm) | Relative to HVLP |
|---|---|---|---|
| ED (standard) | ~2.0 | 0.85 | +63% |
| Low‑profile ED | ~1.2 | 0.72 | +38% |
| RTF (reverse treated) | ~0.8 | 0.61 | +17% |
| HVLP / VLP | ~0.4 | 0.52 | reference |
Test conditions: 8‑mil RO4350B core, 1/2‑oz starting copper, microstrip line width 0.42 mm (50 Ω), solder mask removed, measured by VNA with SOLT calibration, de‑embedded to line ends.
1. Why Copper Roughness Matters at 28 GHz
At 28 GHz, skin depth in copper is ≈0.39 µm – only about one‑fifth the thickness of a human hair. Current flows almost exclusively in an ultra‑thin surface layer. When the copper surface is rough:
- The effective current path lengthens (follows valleys and peaks)
- Local current density increases near peaks
- Result: higher resistance and higher insertion loss
Engineering fact
A rough surface can increase conductor loss by 20–50% compared to an ideally smooth surface at mmWave frequencies.
2. Measurement Method (Reproducible)
We used a delta‑loss (Δ‑loss) coupon design per IPC‑TM‑650‑2.5.5.14:
- Two identical 50 Ω microstrip lines, length 50 mm
- Reference line: HVLP copper (Ra ≈0.4 µm)
- Test lines: other copper types on same panel
- VNA measurement from 10 MHz to 40 GHz, after SOLT calibration
- Fixture de‑embedding using TRL (thru‑reflect‑line) to remove connector effects
Uncertainty: ±0.03 dB/cm (95% confidence)
3. Detailed Measured Data
| Copper type | Ra (µm) | RMS slope (deg) | Insertion loss @28GHz (dB/cm) | Notes |
|---|---|---|---|---|
| ED | 2.05 | 18 | 0.85 | Highest loss, visible waviness |
| Low‑profile ED | 1.18 | 12 | 0.72 | Common in volume production |
| RTF (Mitsui) | 0.82 | 9 | 0.61 | Good balance of cost and performance |
| HVLP (JX Nippon) | 0.41 | 5 | 0.52 | Best for high‑performance mmWave |
| Ideal smooth (simulation) | 0 | 0 | 0.44 | Theoretical minimum |
Key insight
Even HVLP copper (0.4 µm) still adds 0.08 dB/cm over an ideal smooth surface – this is the residual “real‑world” penalty.
4. Engineering Implications for 28GHz Designs
| Application | Recommended copper | Reason |
|---|---|---|
| 5G FR2 (n257, n258, n261) | HVLP or RTF | Loss budget tight; every 0.1 dB matters |
| Point‑to‑point backhaul | HVLP | Long traces, low loss critical |
| Automotive radar (24/77 GHz) | HVLP | Phase stability also benefits from smooth copper |
| Consumer mmWave devices | RTF or low‑profile ED | Balance between performance and cost |
| Low‑volume prototypes | Any, but measure coupon | Use HVLP for accurate performance assessment |
Rule of thumb: If your line length exceeds 20 mm at 28 GHz, HVLP copper is strongly recommended.
5. How to Specify Copper Roughness on Your Fabrication Drawing
Do not just write “low‑loss copper”. Be explicit:
- Lamination orientation: smooth side toward signal layer
- Etch compensation: adjusted for HVLP (reduced undercut)
- Surface finish: ENEPIG or OSP (ENIG not recommended on RF traces)
UltroNiu standard: We provide copper roughness measurement reports on request, using a white‑light interferometer (ISO 25178).
6. Cost vs Performance Trade‑off
| Copper type | Relative material cost | Relative fabrication cost | Best for |
|---|---|---|---|
| ED | 1.0x | 1.0x | Low‑frequency, cost‑driven |
| Low‑profile ED | 1.1x | 1.0x | Medium‑volume, moderate speed |
| RTF | 1.2x | 1.05x | Good balance for mmWave prototyping |
| HVLP | 1.4x | 1.1x | High‑performance mmWave, radar, 5G |
ROI perspective
The extra copper cost is typically <5% of total board cost, but can improve link margin by 1–2 dB – often the difference between pass and fail.
7. Practical Checklist for Your Next Design
- Specify copper type on each layer (do not leave default)
- Request profilometry data from your fabricator for the production lot
- Design Δ‑loss coupons that match your critical line length and layer
- Simulate with roughness model (e.g., Hammerstad or Groisse) – not ideal copper
- Remove solder mask from all mmWave transmission lines
- Validate first article with TDR and VNA before full production
8. Frequently Asked Questions
Q1: Is HVLP always necessary for 28GHz?
Not always, but strongly recommended for any line longer than 20 mm or when loss budget is tight. For very short interconnects (<10 mm), RTF may suffice.
Q2: How does copper roughness affect phase?
Roughness slightly increases effective dielectric constant (due to field trapping), causing small phase delay. For most 28GHz systems, phase effect is secondary to amplitude, but for phased arrays it can matter.
Q3: Can I measure copper roughness myself?
You need a profilometer or atomic force microscope (AFM). Most engineers rely on the fabricator’s data. UltroNiu offers independent roughness verification as part of our material governance service.
Q4: Does surface finish change the effective roughness?
Yes. ENIG adds a nickel layer that can increase loss. ENEPIG is better, OSP adds negligible loss. For best RF performance, specify OSP on RF layers and ENIG only on non‑RF pads.
Related Engineering Resources
References: IPC‑TM‑650‑2.5.5.14 (Δ‑Loss), ISO 25178 (profilometry), Rogers RO4350B datasheet.
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